Two papers at the International Conference on Emerging eLearning Technologies and Applications

The paper entitled “Measurement of a Wireless Power Transfer System with a Fully Integrated Receiver” and the paper entitled “EKV Transistor Model For Ultra Low-Voltage Bulk-Driven Circuits” have been published in the proceedings of the 17th International Conference on Emerging eLearning Technologies and Applications 2019!

The first paper deals with the measurement setup development for evaluating a fully integrated wireless power receiver. The receiver is designed for application in wireless implantable medical devices (IMD), where the size of the receiver is critical, thus a fully integrated solution is advantageous. The receiver was designed in a standard 130 nm CMOS technology and operates at 200 MHz. To evaluate its performance, the transmitter has to be implemented. Analysis of the transmitter coil magnetic field, leading to the optimal transmitter coil size is presented. The impedance matching network is also described in detail. The preparation of the receiver samples is discussed, mainly focusing on the minimization of parasitic influences of the package and the chip seal ring on the receiver coil performance. Preliminary measurement results demonstrate the functionality of the system. The design of the measurement setup requires knowledge of multiple aspects of electronic design, mainly in the fields of high frequency design, microelectronics and printed circuit board design. Therefore, it is suited as a practical demonstration for students of these fields in particular.

The second paper contains a description of EKV transistor model properties and its application in ultra low-voltage and/or low-power integrated circuit design. The authors also discuss and investigate the suitability of the model for rather unconventional bulk-driven approach to circuit design. Moreover, a modified EKV model v2.6 parameter extraction sequence is proposed, where deeper understanding of the model itself and better overall correlation between the measured data and simulation results is introduced. The obtained knowledge about the extended extraction procedure has been directly incorporated into the curriculum of IC design-related classes and student projects, since modeling and simulation belong to the key education activities in microelectronics field.

 

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